A data acquisition and analysis system for voltage versus luminous intensity transfer characteristic measurements in flat panel displays

In this study the time domain transfer function h(t) of luminescent display panels has been determined for the first time by the cross-correlation technique. The signature of the impulse response is immediately useful as a research tool and has potential application in the control of manufacturing process parameters. A prototype data acquisition and analysis system was designed and constructed. The system was interfaced to a Thorn EMI 9813 photomultiplier. The primary application of the system, in this case, was to measure the forward transfer characteristics of ZnS:Mn,Cu DCEL (DC electroluminescence) pixels. The system employs cross-correlation techniques based on a 1023, PRBS (pseudo random binary sequence) maximal length sequence with a bit rate of 50 kHz. The digitized luminous output is temporarily stored in static RAM. The data is subsequently transferred to a microcomputer where h(t) is derived by a cross-correlation algorithm.<
>