Some thoughts on sine wave ADC testing

This paper proposes state-transition plane and error plane methods to identify the ADC error type (such as additive noise, multiplicative noise, jitter and harmonics) in the sine wave ADC testing, and the theoretical analysis and simulation results demonstrate their effectiveness. Also an ADC output waveform reconstruction algorithm which is applicable for an incoherent sampling ADC testing is proposed. These results would be useful for developing new error correction algorithms and analyzing the sine wave ADC testing theoretically as well as identifying ADC error sources.