Scattering parameter characterization of microwave optoelectronic devices and fiber-optic networks

A microwave fiber-optic network analyzer test set is proposed that will allow the application of two-port calibration theory to the measurement of optical and optoelectronic components in high frequency fiber-optic links. Formulae for the optoelectronic calibration are presented. A unified approach to optical and optoelectronic two-port calibration theory is covered.<
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