A Physics-Based Compact Model for Transition-Metal Dichalcogenides Transistors With the Band-Tail Effect

Due to structural disorder effects, variable range hopping (VRH) transport via band-tail states has been widely observed in the transition-metal dichalcogenide field-effect transistor (TMD FET). However, this significant mechanism has not been incorporated into existing compact models. In this letter, a continuous physics-based compact model considering VRH in TMD FET is developed. Key parameters are extracted by calibration to experimental molybdenum disulfide FET. The voltage dependent carrier density and temperature dependent current characteristics are physically predicted by utilizing the general percolation theory and generalized Einstein relation. Our model is validated by the good agreement between the simulation and experimental results. Furthermore, the relationship between the disorder effects and circuit-level performances are presented. This letter is significant for material engineering and device optimization of TMD FET.