Application of linear sampling method for identifying location of small dielectric inhomogeneities in a half-space

In this contribution, we apply well-known linear sampling method to localize dielectric inhomogeneities with small radii that are completely embedded in a two-dimensional half-space. This approach uses an asymptotic expansion of the far-field pattern in the presence of such inhomogeneities. Based on numerical experiments, we observe the advantages and disadvantages of the linear sampling method.