An optimal test sequence for the JTAG/IEEE P1149.1 test access port controller

A test sequence is given for the test access port (TAP) controller portion of the boundary-scan architecture proposed by the Joint Test Action Group (JTAG) and IEEE Working Group P1149.1 as an industry-standard design-for-testability technique. The resulting test sequence, generated by using a technique based on Rural Chinese Postman tours and unique input/output sequences, is of minimum cost (time) and rigorously tests the specified functional behavior of the controller. The test sequence can be used for detecting design faults for conformance testing or for detecting manufacture-time/run-time defects/faults.<
>