SPICE-level layout-aware single event effects simulation of majority voters

We present the simulation results comparing the upset sensitivity of different types of the majority voters. We conducted the SPICE-level simulations by means of the proposed technique that provides layout-aware analysis taking into account diffusion and circuit effects. The calibration of the model parameters was provided by the analysis of experimental SEU cross section and sensitivity maps of 6T-cell based SRAM designed and manufactured using the same technology as the majority voters. We also consider the applicability margins of the proposed model.