BIT and testability for millimeter wave systems

The authors provide a basis for understanding BIT related and MMW (millimeter wave) system attributes which offer potential for transportability of current RF/microwave BIT concepts. A comparison of MMW and microwave technology provides a basis for identifying areas where there may be opportunity for the transfer of microwave BIT technology and testability techniques to MMW as well as areas where there is need for new MMW BIT technology development. The authors also describe the current status of device technology, design tools, and implementation techniques applicable to MMW BIT. It is noted that the advent of total MMW systems fabricated on a single monolithic substrate greatly increases the importance of testability and BIT.<
>