Total ionizing dose influence on the single event effect sensitivity of active EEE components

Radiation hardness of active EEE electronic devices with regards to space environment is characterized according to two main aspects: cumulated effects and single event effects. The radiation qualification process includes Total Ionizing Dose (TID), Total Non-Ionizing Dose (TNID) and Single Event Effect (SEE) tests, usually performed independently. The aim of this study is to evaluate the potential synergistic effects of TID on SEE sensitivity and assess the consequences in terms of radiation hardness assurance for various space missions and especially the JUICE mission to Jupiter where the TID levels encountered will be significantly higher than in other interplanetary or Earth-orbiting missions. Several radiation test campaigns, combining TID and SEE testing, were conducted on four types of devices: an ADC, a DAC, an SRAM and a NAND Flash.