On modeling of excitation ports in the time-domain contour-integral method

This contribution reports on modeling of excitation ports in the time-domain contour integral method. In this respect, two modeling strategies are presented. The first approach is very general and allows for the incorporation of rather complex excitation mechanisms including the vertical-probe and microstrip-line feeds. The second way is computationally more efficient but its application is limited to special cases. A numerical example that validates the feeding model is given.