A methodology for short term and long term NBTI prediction under any bias conditions

A SPICE-level aging simulation methodology is developed to predict the NBTI degradation in short term and long term region. This methodology enables 10 years NBTI aging prediction under any bias conditions (including stress and recovery) by completing the time-tracing and extrapolation procedures in a single step. The proposed methodology significantly improves the speed of the long term simulation without scarifying calculation accuracy.