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Circuit modeling of the ISO 10605 field coupled electrostatic discharge test to design robust automotive integrated circuits | IEEE Conference Publication | IEEE Xplore

Circuit modeling of the ISO 10605 field coupled electrostatic discharge test to design robust automotive integrated circuits


Abstract:

In this paper, we develop a circuit model for the ISO 10605 field coupled ESD test setup. Here, the model is applied to a wire harness consisting of three wires and the d...Show More

Abstract:

In this paper, we develop a circuit model for the ISO 10605 field coupled ESD test setup. Here, the model is applied to a wire harness consisting of three wires and the device-under-test is a pressure sensor chip designed for use in the automotive industry, allowing to illustrate and validate the proposed circuit model for the ISO 10605 field coupled ESD test on a real application.
Date of Conference: 04-08 July 2017
Date Added to IEEE Xplore: 03 August 2017
ISBN Information:
Conference Location: St. Petersburg, Russia

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