Noise fluctuation changes related to edge deletion of thin-film Cu(In,Ga)Se2 solar cells

Low-frequency noise and I-V characteristics of reverse-biased thin-film chalcopyrite CIGS solar cell with a metal wrap through architecture were measured in order to evaluate the efficiency of edge deletion by a fine grinding and polishing. These electrical measurements were supplemented by a microscale exploration of the edges, electroluminescence mapping, and lock-in IR thermography. Research efforts are related to the local technological as well as purposely induced structure defects investigation.