Variation- and degradation-aware stochastic behavioral modeling of analog circuit components

Process variation and aging effects influence the performances of integrated circuits in modern technology nodes. In this paper, a method is proposed to build a behavioral model to represent the influences of process variation, aging and operational parameters on circuit performances. The variability of performance is represented using distribution functions while Response Surface Models (RSM) are used to describe the dependence of the distribution's moments on operational parameters. Compared to other approaches, less parameters have to be included in the RSM therefore reducing the complexity. This enables a fast Monte-Carlo analysis with aging analysis on a behavioral level. The method is evaluated for a voltage reference circuit and an operational amplifier showing a good representation of the variability and reaching a very good speedup of simulation time.