Efficient Si-SiO2/Si-Si3N4 grating SOI structure for optical interconnect in communication system

This paper gives high efficiency silicon-silicon dioxide (Si-SiO
2
) and silicon-silicon nitride (Si-Si
3
N
4
)) grating SOI structure, which may be used as optical interconnects in optical communication system. Both the absorption, reflection and diffraction losses are included to compute overall transmitted efficiency. Simulation results reveal that the reflectance is zero at the wavelength of 1 μm for both Si-SiO
2
and Si-Si
3
N
4
grating structure. It is also seen in both cases that diffraction efficiency as well as overall transmitted efficiency is nearly constant and is more than 98% with pertaining to Bragg's angle, which ranges from −0.8 radian to +0.8 radian. The simulation is done by using plane wave expansion (PWE) method with the help of MATLAB software.