Error-Corrected Reflection and Transmission Scattering Parameters of a Two-Port Device

We present an error correction algorithm for extraction of reflection and transmission scattering (S-) parameters of a two-port device without resorting to a complete two-port calibration. It is shown that S-parameters of thru and nonreflecting line connections in addition to S-parameters of an unknown device (and its reversed orientation) are needed for extracting full S-parameters of the device. For validation, we performed simulations for a chiral metamaterial (transmission asymmetric) and carried out measurements of S-parameters of an asymmetrically loaded waveguide section (reflection asymmetric).