Modified triangular wave for dynamic quality tests of A/D converters

The generation of high quality test signals with well-controlled level and time properties have played a vital role in all testing areas. Usually the requirements for accuracy of levels and spectral purity cannot be met simultaneously. The result is that spectrally pure sine wave sources have low magnitude and frequency stability due to the high Q value frequency selective circuits. On the other hand the highly stable signal sources have poor spectral purity. In this paper an attempt is made to find out the nonsine wave test signal to meet most A/D converter test requirements.