A Charge Mapping Method for the Capacitance of Conducting Plate

In this letter, a charge mapping method (CMM) is proposed to solve for the charge distribution and capacitance of conducting plate. Based on two examples, it is speculated that linear transformation plays a more important role than the mapping of boundary curves in the charge mapping between two conducting plates. The capacitances for rectangles and parallelogram conducting plates are simulated to validate the proposed CMM. Compared with the method of moments (MoM), the CMM exhibits same level of precision with a relative error of 2%, but takes less time as the linear transformation scale is increased. This is due to a reduction in the dimension of calculated matrix equation. When the linear transformation scale is 450, computation time using the CMM is only about 1/3rd of that required by MoM.