Foreword to the Special Section on the IEEE International On-Line Testing and Robust System Design Symposium (IOLTS) 2016

This Special Section of IEEE Transactions on Device and Materials Reliability includes a collection of the best papers of the latest (2016) edition of an established IEEE symposium which focuses for more than two decades on the challenges and solutions for electronic circuits and systems on-line testing and fault tolerance. Held for 21 years as the IEEE International On-Line Testing Symposium it was renamed in 2016 to International On-Line Testing and Robust Systems Design Symposium keeping its well recognized acronym IOLTS.