Effect of thickness on the dielectric properties of Pb(Mg/sub 1/3/Nb/sub 2/3/)O/sub 3/ (PMN) thin film prepared by sol-gel method

The dependence of thickness on the dielectric and ferroelectric characteristics were examined for a Pb(Mg/sub 1/3/Nb/sub 2/3/)O/sub 3/ (PMN) thin film prepared by the sol-gel method. The films had stoichiometric composition and epitaxially grown on (100)Pt//(100)MgO substrate. The dielectric constant was decreased with the decrease of thickness, however, the frequency dispersion of the dielectric constant which is characteristic for the relaxor was observed. P-E hysteresis was also observed for the PMN thin film, however, the remanent polarization was much smaller than the value reported for PMN bulk ceramics. These facts imply that the size-effect is also observed for relaxor ferroelectrics.