A general imperfect-software-debugging model with S-shaped fault-detection rate

A general software reliability model based on the nonhomogeneous Poisson process (NHPP) is used to derive a model that integrates imperfect debugging with the learning phenomenon. Learning occurs if testing appears to improve dynamically in efficiency as one progresses through a testing phase. Learning usually manifests itself as a changing fault-detection rate. Published models and empirical data suggest that efficiency growth due to learning can follow many growth-curves, from linear to that described by the logistic function. On the other hand, some recent work indicates that in a real industrial resource-constrained environment, very little actual learning might occur because nonoperational profiles used to generate test and business models can prevent the learning. When that happens, the testing efficiency can still change when an explicit change in testing strategy occurs, or it can change as a result of the structural profile of the code under test and test-case ordering.