Characteristic temperature dependence of the maximum Josephson current in Bi-Sr-Ca-Cu-O intrinsic junctions

We have measured the temperature dependence of the maximum Josephson current I/sub c/ for 15-30 nm thick stacks comprised of 10 to 20 Bi/sub 2/Sr/sub 2/CaCu/sub 2/O/sub 8+/spl delta// intrinsic junctions. It is found that I/sub c/ typically shows little saturation at low temperatures but continues to increase noticeably as temperature decreases towards T=0. This behavior becomes significant as the normal tunneling resistance increases with decreasing oxygen content.