An automatic test equipment for integrated circuits in the extreme environments

This paper describes an automatic test equipment for integrated circuits. Most traditional automatic test equipments focus on integrated circuits tests in conventional environments. They usually can not test integrated circuits in the extreme environments, such as thermal cycling, thermal vacuum, vibration and shock. Some can accomplish the tests in only one kind of extreme environment. We invent an automatic test equipment that can test integrated circuits in various extreme environments, such as thermal cycling, thermal vacuum, vibration and shock. We use this equipment to evaluate the feasibility of using the tested integrated circuits in space navigation. The actual use of this ATE demonstrates its obvious advantage in environmental tests.