“In silicon” verification of Multi-Functional Control Integrated Circuits in 250 nm BCD technology for high-efficiency power converters

This work represents results of verification of experimental samples of Multi-Functional Control Integrated Circuits (MFC IC) developed for modern low power, high-efficiency power supply units. MFC IC samples have been designed and manufactured in 250 nm BCD IC technology that combines CMOS, bipolar and DMOS. Electrostatic Discharge protection solution developed for 2000 V is analyzed.