An efficient probabilistic method for logic circuits using real delay gate model

Our goal is the development of a novel probabilistic method to estimate accurately the power consumption of a logic level circuit under real delay model generalising fundamental principles of zero delay-based methods. Based on Markov stochastic processes, a set of new formulas, which describe the temporal and spatial correlation in terms of the associated zero delay-based parameters, under the real delay model, are introduced. The chosen gate model allows accurate estimation of the functional and spurious (glitches) transitions, leading to accurate power estimation. A comparative study of benchmark circuits demonstrates the accuracy of the proposed method.