Dynamic testing on A. D. C. stuck fault tester

This paper describes a technique for dynamically testing (1) a micro processor based logic card by means of a D.C. Stuck Fault (2) oriented tester. The microprocessor must contain on-board registers and diagnostic microcode (3) which can be activated by the tester to begin an automatic dynamic self-test of the logic card. Resultant diagnostic information is then latched an a channel to be interrogated at D.C. tester speed (4).