Study of contact resistance in connectors with physical simulation using nano-fabrication

Contact resistance of electrical contact in connectors consists of constriction resistance that results from narrowing current and film resistance of high resistivity material between two electrodes. Constriction resistance depends on the number of contact points and their sizes. In the case of a simplified single point contact, the constriction resistance can be calculated analytically, however it is not the case for a real contact. To establish a relationship between the physical structure of an electrical contact and its constriction resistance, samples that represent the contact-simulated structure have been fabricated on a Si-chip for the measurements analysis of the constriction resistance.