A Hierarchical Data Structure To Support Diagnostic Testing

The diagnostic testing of large integrated circuits is described using an electron-beam prober to measure internal waveforms. The design data of a specimen is displayed to guide interactive testing. Further, this design data is organized as a hierarchy of symbolic objects, to facilitate the extraction of circuit models. In particular, connected structures are maintained as entities, making it easier to generate simulated waveforms rapidly for comparison with measurements from designated nodes in the device. An implementation of the data structure is presented, in Ada, which was developed under contract for the US Army, Fort Monmouth, NJ.