Vertical CBRAM (V-CBRAM): From Experimental Data to Design Perspectives

In this paper, we propose the integration of an Al2O3/CuTe
_x
based Conductive Bridge RAM (CBRAM) device in vertical configuration. The performances of the memory devices are evaluated. 20ns switching time, up to 106 cycles and stable 150°C retention were demonstrated. Functionality is compared with Vertical RRAM integrating an HfO2/Ti OXRAM stack, showing the pros and cons of each configuration. Then 2 potential applications are discussed using design approach. For high density, the Vertical RRAM cell features and circuit are dimensioned to optimize the memory page density. Finally, for neuromorphic applications, selector and array configuration are tuned to reduce the variability in terms of voltage seen by each cell constituting a vertical synapse.