Reduction of Noise Using Continuously Changing Variable Clock and Clock Gating for IC Chips

The performance of silicon chip depends on the operating voltage of the chip. The chip should be designed using proper power and ground bond pads to minimize the power supply noise. When the chip starts working from the sleep mode, then the sudden rise in current inside the chip causes LdI/dt noise. This noise reduces the power supply voltage, which in turn reduces the operating frequency of the chip. This makes the chip manufacturer to sell products of high-performance chips at a lower operating frequency. In order to ramp this current slowly, an innovative and fundamentally new method is implemented. In this proposed method, we have increased the operating frequency inside the chip slowly (from f
_min
to f
_max
) to control the current ramp and at the same time performed clock gating (CG) to minimize noise by suppressing the current drawn by the device. We have applied this concept of variable frequency together with CG in a 3-b up counter to demonstrate that one can construct a design where the clock can be modulated during its functional operation without any functional failure.