Microstructural Characterization Of Polycrystalline Thin Film CulnSe/sub 2/: A Promising Yet Complex Material For Photovoltaic Applications.

The electrical, optical, microstructural, and morphological properties of polycrystalline thin film CuInSe/sub 2/ are investigated by X-Ray Diffraction, spectrophotometry, and Transmission Electron Microscopy as a function of compositional parameters and processing conditions. The film microstructure is redefined as a compositionally and temperature dependent polycrystalline aggregate mixture of CulnSe/sub 2/ and Cu/sub x/Se/ln/sub y/Se minor phases, with a core crystallite exhibiting order-disorder and a CuInSe/sub 2/- Culn/sub 2/Se/sub 3.5/ phase separation and/or solid solution.