Plasmon Dispersion at an Interface Between a Dielectric and a Conducting Medium With Moving Electrons

Dispersion of the plasmonic behavior at an interface between a dielectric and a conducting medium (e.g. metal, doped semiconductor, graphine, or superconductor) is studied considering the free electron gas in the conducting medium be moving along the interface. The derivation of the dispersion equation is provided, including the damping and the electrons drift. It is shown that the electrons behave as a compressible gas giving rise to new features and new surface plasmon wave solutions of the dispersion equation. A normalized form of the derived dispersion equation is obtained. It is then employed to study the general properties numerically using typical semiconductor material parameters found recently experimentally. Results are discussed in the light of possible novel applications of these physical effects such as, for example, plasmons propagation loss compensation.