An efficient random-like testing

This paper introduces the concepts of random-like testing. In a random-like testing sequence, the total distance among all of the test patterns is chosen maximal so that the sets of faults detected by one test pattern are as different as possible from that of faults detected by the tests previously applied. Procedure of constructing a random-like testing sequence (RLTS) is described in detail. Theorems to justify the effectiveness and helpfulness of the procedure presented are developed. Experimental results on benchmark circuits as well as on other circuit are also given to evaluate the performances of our new approach.