A non-scan DFT method for controllers to achieve complete fault efficiency

This paper presents a non-scan design-for-testability method for controllers that are synthesized from FSMs (Finite State Machines). The proposed method can achieve complete fault efficiency: test patterns for a combinational circuit of a controller are applied to the controller using state transitions of the FSM. In the proposed method, at-speed test application can be performed and the test application time is shorter than previous methods. Moreover, experimental results show the area overhead is low.