Characterization of near- and far-field radiation from ultrafast electronic systems

Accurate and computationally efficient characterization of near- and far-field radiation from a class of microwave, millimeter wave, and ultrafast systems is presented. A numerical technique is utilized which combines the finite-difference time domain method with a spatial transformation, the Kirchhoff surface integral. Included in the analysis are inhomogeneous material parameters, small feature size relative to wavelengths of interest, and the wide-band nature of the radiation. Based on simulation results, a simple model of the radiation from an inhomogeneous structure is developed. Finally, the technique is applied to accurately characterize the radiation from a photoconducting structure.