Advanced semiconductor laser based electro-optical sampling system using soliton pulse compression for direct probing at 1.55-/spl mu/m wavelength

We report on a compact, reliable and easy to use electro-optic sampling (EOS) system with high temporal resolution, and increased voltage sensitivity. With an operating wavelength of 1.55 /spl mu/m and subpicosecond time jitter of the optical source, it is particularly suited for characterizing ultrafast long-wavelength photodetectors and receivers as well as electrically synchronized ultrahigh-speed devices and ICs.