A unified analytical expression for aliasing error probability using single-input external- and internal-XOR LFSR

In this paper, an exact unified analytical expression for the transient (and the steady state) behavior of the Aliasing Error Probability (AEP) of signature analysis testing using single-input external- and internal-XOR LFSR is deduced. The expression, contrary to what is known in the literature, uses the leftmost bit of the LFSR.