Optimization of anti-reflective coatings for CIGS solar cells via real time spectroscopic ellipsometry

In this study, we have optimized the anti-reflective coating for Cu(In1−xGax)Se2 (CIGS) absorbers. The structure of the CIGS solar device has been intensively monitored using in-situ spectroscopic ellipsometry, and the thickness has been optimized to optically enhance the performance of the device. Various simulation techniques have been employed to optimize the thickness of the AR coating and this modeling has been correlated with experimental results to obtain the highest efficiency for the device. The overall efficiency has increased approximately by 5% with the new optimized AR coating and the device parameters for the best cells are reported.