In situ Raman characterization of Cu2ZnSnS4 solar absorber material

Copper zinc tin sulfide Cu2ZnSnS4 (CZTS) thin film and powder samples are successfully prepared using a simple sol-gel sulfurization procedure. The samples were characterized using ex situ techniques such as XRD, SEM, EDS. In addition, advanced in situ Raman micro-spectroscopy characterization of CZTS material from room temperature to 650 °C was demonstrated for the first time. Preliminary results show CZTS phase is Raman active up to ∼ 600 °C and in situ Raman is a powerful characterization technique that will provide insights about fundamental CZTS phase formation and secondary phase evolution in real time under practical solar cell processing conditions.