An alternative method for end-effect characterization in shorted slotlines

In this paper, we propose an alternative method to characterize the end effects in shorted slotlines. Using a commercial software to model the transition, a simple mathematical expression of the end impedance, valid for a given substrate family and in a wide frequency domain, was achieved. Several dielectric substrates were considered and the obtained results were compared with experimental ones. A correct agreement was observed. This approach can also be useful in more complex simulations relative to multilayer structures.