Calculating emittance from images of undulator radiation

A method is presented for calculating the emittance of an electron beam from scans of undulator radiation. Scans are affected by electron beam properties, radiation angular distribution, imaging pinhole diffraction, smearing from scanning, and the difference between scan and beam axes, all of which are incorporated. Adding-in-quadrature is also discussed. An application to the low-emittance lattice of the storage ring PEP (Positron-Electron Project) is discussed.<
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