Infrared ellipsometric spectroscopy of Mn1.56Co0.96Ni0.48O4 thin films with different layers

High quality Mn
_1.56
Co
_0.96
Ni
_0.48
O
₄
films with different layers have been prepared on Pt//Ti/SiO
₂
/Si substrate. Infrared optical properties of the films have been investigated using infrared spectroscopic ellipsometry. The optical constants have been obtained by fitting the measured ellipsometric parameter data with classical infrared model.