The effective resolution measurements in scope of sine-fit test

This paper presents a detailed analysis of the effective resolution (efr) measurements in scope of the IEEE Standard 1057 sine-fit test. The results explain not only a poor repeatability in the efr measurement but also give some hints how to improve it. The two-point method proposed here enables the compensation of the inherent bias influence on the efr accuracy. The idea is accomplished by using the correct standard deviation in the efr definition. The standard deviation depends on the amplitude V and dc bias C of a pure sine wave stimulus.