Compact emittance scanners for MeV particle beams

Compact electric sweep emittance scanners have been developed to operate in the mega-electronvolt range. These scanners are suitable for the analysis of electron and ion beams. The scanners have excellent angular resolution despite their compact dimensions. Electrical and mechanical design and scaling parameters are presented. Operational experience with a 1 MeV, 25 mA, 50 mu s H/sup -/ beam is discussed.<
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