Complete analysis of the complex and arbitrary bilateral finlines

An electromagnetic application is developed to obtain the effective dielectric constant, the attenuation constant and the characteristic impedance of the arbitrary bilateral fin lines with semiconductor substrate and conductor thickness simultaneity for the first time. Also the concise transverse transmission line (TTL) full wave method is used in the analysis. New results of the complex propagation and of the characteristic impedance as functions of the frequency and different dimensions and conductivity of the substrate, are obtained in 3D.