Analysis of curve tracer instruments for fault location

A review of testability, fault isolation algorithms, and fault simulation techniques is performed. Within the context of established theoretical and simulation analysis methods for fault isolation, the use of curve tracer instruments is analyzed. Curve tracer instruments are extensively employed by the military, in repair environments, to aid technicians in the isolation and repair of failed circuit boards. An example circuit is analyzed for testability. The circuit is simulated and the results are compared to results taken from a curve tracer instrument. The results are discussed and the implications for deployment of curve tracer instruments as general fault diagnostic aids for electronic component repair are presented.