MFM quantification of magnetic fields generated by ultra-small single pole perpendicular heads

The perpendicular fields emanating from an ultra small perpendicular single pole heads have been quantified using a new MFM field mapping technique. This technique utilizes two MFM tips with different field sensitivities which have been focused ion beam etched to identical geometries. This technique has been used to quantify the perpendicular fields around a 100/spl times/200 nm pole, also fabricated with focused ion beam etching.