A generalized approach to optical low-coherence reflectometry including spectral filtering effects

In the interpretation of optical low-coherence reflectometry measurements, the reflectivity of the device under test is in general supposed to be with a slow dependency on optical wavelength. However, recent research aims at investigating strongly wavelength-dependent devices, such as fiber Bragg gratings and semiconductor lasers. In this paper, a general theory including spectral filtering effects is developed. It appears as a generalization of previously reported results only valid under special conditions.