Measuring transistor dynamic loadlines and breakdown currents under large-signal high-frequency operating conditions

The "Nonlinear Network Measurement System" accurately measures dynamic loadlines and breakdown currents of microwave transistors under high-frequency large-signal operating conditions. This measurement capability allows the designer to find optimal operating conditions for a given device without the need for large-signal models. Measuring RF breakdown currents allows the designer to tackle reliability issues in a way not possible before.