CMOS technology characterization for analog and RF design

Characterization of CMOS technologies for digital applications often proves inadequate for analog and RF design. This paper describes a set of characterization vehicles and tests that quantify the analog behavior of active and passive devices in CMOS processes, in particular, properties that are not represented accurately in SPICE models. Test structures and circuits are introduced for measuring speed, noise, linearity, loss, matching, and dc characteristics.